The wide area metrology (WAM) system provides monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels. The system allows panel producers to implement process optimization solutions that enhance average panel efficiency, improve line productivity and verify full compliance with the durability and quality requirements.
The system architecture allows for easy integration into the design of new production lines or insertion into existing ones, including Gen 5 and Gen 8.5 lines. With its True Cell technology, the InSight is able to measure and map critical layers on-the-fly within the actual product stack, providing process fingerprinting that drives production improvement, excursion detection and line productivity, BrightView said.
The InSight M Series represents a systems approach to enhancing thin-film production. The tool is complemented by an intuitive operating interface and software modules that allow easy implementation and customization of intelligent line monitoring recipes, spanning all production stages, from process integration, through pilot and multi-location volume manufacturing, said the company.
Benny Shoham, CEO of BrightView, said: “By combining an in-line metrology technology and matching spatial data analysis solutions that are driven by in-depth knowledge of thin-film PV process and volume production, the InSight M Series is the integral solution for improving thin-film PV panel efficiency and long-term reliability.
“Thin-film manufacturers are now able to differentiate their products, and optimize their production lines in order to boost productivity, and profitability.”
BrightView delivers process control and optimization solutions dedicated to thin-film solar panel manufacturing.
